According to DIN ISO 3497, DIN 50987, and ASTM B568 Used for RoHS analysis, electroplating/electrophoretic plating analysis Minimum measurement area of 0.2mm² with micro-focus X-ray generator and advanced optical switching focusing system Equipped with manual zoom technology, it allows for non-destructive testing of irregular components with depths from 0 to 30mm Core EFP algorithm for simultaneous analysis of 23 plating layers, 24 elements Equipped with an intelligent vacuum system, it enhances the precision of analysis for platings of light elements, resulting in more stable data